Hardware test generation
6 methods in the atlas attack this one problem. They are rivals: each wins something the others do not.
Phrasings that mean this problem
Test pattern generationFault coverage analysisDesign for testability
vlsi-eda
- D-algorithmD-cube fault propagationstandardvlsi-eda
- PODEMPath-oriented decision makingstandardvlsi-eda
- FAN algorithmFanout-point backtracingspecialistvlsi-eda
- Fault simulationParallel-pattern single-fault propagationspecialistvlsi-eda
- Scan chain insertionSerial shift test accessspecialistvlsi-eda
- Built-in self-testLFSR pattern and signature compactionspecialistvlsi-eda